학술논문

A method to measure the complex permeability of thin films at ultra-high frequencies
Document Type
Periodical
Source
IEEE Transactions on Magnetics IEEE Trans. Magn. Magnetics, IEEE Transactions on. 32(5):4905-4907 Sep, 1996
Subject
Fields, Waves and Electromagnetics
Permeability measurement
Transistors
Magnetic films
Frequency measurement
Impedance measurement
Strips
Testing
Magnetic analysis
Magnetic recording
Magnetic heads
Language
ISSN
0018-9464
1941-0069
Abstract
A swept frequency method for measuring the magnetic permeability of thin films for frequencies up to 2 GHz with a resolution at 1 GHz of /spl sim/0.1 /spl mu/m in permeance is described. It is based on the measurement of impedance of a strip loop loaded with the sample under test. The method employs a commercial impedance or network analyzer, is simple, and suitable for permeability measurements of thin magnetic films which are used in recording heads and microwave components.