학술논문
Beam test of a large area n-on-n silicon strip detector with fast binary readout electronics
Document Type
Periodical
Author
Unno, Y.; Nakao, M.; Fujita, K.; Ciocio, A.; Dane, J.; Dubbs, T.; Emes, J.; Gilchriese, M.; Grillo, A.; Haber, C.; Handa, T.; Holland, S.; Iwasaki, H.; Iwata, Y.; Kashigin, S.; Kipnis, I.; Kohriki, T.; Kondo, T.; Kroeger, W.; Lozano-Bahilo, J.; Moorhead, G.; Ohsugi, T.; Pier, S.; Rowe, B.; Sadrozinski, H.F.W.; Shapiro, M.; Siegrist, J.; Spencer, E.; Spieler, H.; Tamura, N.; Takashima, R.; Terada, S.; Wilder, M.
Source
IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 44(3):736-742 Jun, 1997
Subject
Language
ISSN
0018-9499
1558-1578
1558-1578
Abstract
A large area (60 mm/spl times/60 mm) n-bulk and n-strip readout silicon strip detector prototype was fabricated for the ATLAS SCT detector. Detector modules with a strip length of 12 cm were made by butting two detectors. One of the 12 cm modules was irradiated with protons to a fluence of 1.2/spl times/10/sup 14/ p/cm/sup 2/, and a beam test was carried out for the non-irradiated and the irradiated detector modules. Efficiency and noise occupancy were analyzed using the beam test data. High efficiency was obtained for both detectors in the bias voltages down to about half the full depletion voltage. The noise occupancy was