학술논문

Temperature dependent electrical characteristics of silicide/silicon junctions
Document Type
Conference
Source
ASDAM 2000. Conference Proceedings. Third International EuroConference on Advanced Semiconductor Devices and Microsystems (Cat. No.00EX386) Advanced semiconductor devices and microsystems Advanced Semiconductor Devices and Microsystems, 2000. ASDAM 2000. The Third International EuroConference on. :39-42 2000
Subject
Components, Circuits, Devices and Systems
Engineered Materials, Dielectrics and Plasmas
Temperature dependence
Electric variables
Silicides
Silicon
Temperature distribution
Thermionic emission
Conductivity
Annealing
Temperature measurement
Schottky diodes
Language