학술논문

p-IrOx/n-β-Ga2O3 Heterojunction Diodes With 1-kV Breakdown and Ultralow Leakage Current Below 0.1 μA/cm2
Document Type
Periodical
Source
IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 71(3):1587-1591 Mar, 2024
Subject
Components, Circuits, Devices and Systems
Engineered Materials, Dielectrics and Plasmas
Films
Photonic band gap
Heterojunctions
Metals
Thermal stability
Fermi level
Semiconductor device measurement
β-Ga₂O₃
breakdown voltage
diode
IrOₓ
p-n heterojunction
reverse leakage current
Language
ISSN
0018-9383
1557-9646
Abstract
A p-type IrOx was first applied to $\beta $ -Ga2O3 p-n heterojunction diodes (HJDs) in this work. It was fabricated by oxygen ion beam-assisted deposition (IBAD) method with a hole concentration of $10^{{21}}$ /cm3. Ir $^{{3}+}$ is the main valence state confirmed by X-ray photoelectron spectroscopy (XPS). The bandgap of 2.9 eV was determined by the transmittance spectrum, which is consistent with the HSE06 calculated band structure of Ir2O3. p-n HJDs were realized by deposition p-type IrOx layer on a lightly doped n-type $\beta $ -Ga2O3 epitaxial layer without optimized electric field management techniques. A high breakdown voltage ( ${V} _{B}$ ) of 1005 V and a relatively low specific ON-resistance ( ${R} _{{ \text {ON, sp}}}$ ) of 4 $\text{m}\Omega \cdot $ cm2 were achieved. In particular, the reverse leakage current density remained below $0.1 ~\mu \text{A}$ /cm2 before breakdown. The results provide a new way to develop high-quality $\beta $ -Ga2O3 p-n heterojunction.