학술논문
Data mining integrated circuit fails with fail commonalities
Document Type
Conference
Author
Source
2004 International Conferce on Test International test conference Test Conference, 2004. Proceedings. ITC 2004. International. :661-668 2004
Subject
Language
Abstract
We describe ways to use fail data from many failing integrate circuits (ICs) to determine which ICs failed because of similar causes, rather than to determine the cause of each individual failing IC. The purpose of finding clusters of similarly failing ICs is to focus on systematic defects, and to de-emphasize random ones. Once large groups of similarly failing ICs have been identified, a selection of the ICs in each group can be diagnosed using standard diagnostic routines.