학술논문

An improved multiple edge responses method for memory simulation considering worst case and nonlinear crosstalk
Document Type
Conference
Source
2015 IEEE Symposium on Electromagnetic Compatibility and Signal Integrity Electromagnetic Compatibility and Signal Integrity, 2015 IEEE Symposium on. :139-143 Mar, 2015
Subject
Aerospace
Communication, Networking and Broadcast Technologies
Engineering Profession
Fields, Waves and Electromagnetics
General Topics for Engineers
Signal Processing and Analysis
Crosstalk
Switches
Integrated circuit modeling
Jitter
Program processors
Personal digital assistants
Apertures
intersymbol interference
peak distortion analysis
worst case crosstalk
eye diagram
multiple edge responses
nonlinearity
parallel link
DDR
memory
Language
Abstract
Although multiple edge responses method has been proven effective to capture the input and output nonlinearity in a channel simulation, the method may not be applicable for memory simulation due to the nonlinear crosstalk effect and also the requirement of a massive number of step responses, which significantly reduces the simulation efficiency. In this work, we present an improved simulation methodology involving multiple edge responses to accurately estimate the worst-case eye diagram, specifically applicable for memory simulation. The proposed method is able to capture the nonlinearity effect due to crosstalk, plus has nearly 20 times simulation acceleration compared with the traditional long random input bit pattern simulation, based on a multiple processors system.