학술논문

Acceleration of the ADC Test With Sine-Wave Fit
Document Type
Periodical
Source
IEEE Transactions on Instrumentation and Measurement IEEE Trans. Instrum. Meas. Instrumentation and Measurement, IEEE Transactions on. 62(5):880-888 May, 2013
Subject
Power, Energy and Industry Applications
Components, Circuits, Devices and Systems
Frequency estimation
Frequency-domain analysis
Histograms
Estimation
Standards
Discrete Fourier transforms
Time-domain analysis
Analog-to-digital conversion (ADC)
Blackman–Harris window
histogram test
sine fit
sine frequency estimation
Language
ISSN
0018-9456
1557-9662
Abstract
Sine-wave fitting is usually done with least-squares minimization in the time domain. This can be slow when the number of samples is large ($10^{5} {-} 10^{6}$ or more). It is shown that the fit can be done more effectively in the frequency domain using the Fourier transform of windowed data. This paper shows that using a Blackman–Harris window, it is enough to process just a few samples around the sine peak. To obtain accurate results in analog-to-digital converter (ADC) characterization, the input signal has to meet strict conditions, namely, coherent sampling and uniform distribution of phases. It will be shown that the precision of the estimator is enough to determine if the signal meets the two aforementioned conditions, and sometimes, it provides even better results than the original time-domain least-squares estimator.