학술논문

A 12-b 10-GS/s Interleaved Pipeline ADC in 28-nm CMOS Technology
Document Type
Periodical
Source
IEEE Journal of Solid-State Circuits IEEE J. Solid-State Circuits Solid-State Circuits, IEEE Journal of. 52(12):3204-3218 Dec, 2017
Subject
Components, Circuits, Devices and Systems
Engineered Materials, Dielectrics and Plasmas
Computing and Processing
Data conversion
Calibration
AC-DC power converters
Power demand
CMOS technology
Power capacitors
CMOS
digitally assisted analog design
direct RF sampling analog-to-digital converter (ADC)
gigahertz data conversion
interleaved (IL) ADC
pipeline ADC
switched capacitor
Language
ISSN
0018-9200
1558-173X
Abstract
A 12-bit 10-GS/s interleaved (IL) pipeline analog-to-digital converter (ADC) is described in this paper. The ADC achieves a signal to noise and distortion ratio (SNDR) of 55 dB and a spurious free dynamic range (SFDR) of 66 dB with a 4-GHz input signal, is fabricated in the 28-nm CMOS technology, and dissipates 2.9 W. Eight pipeline sub-ADCs are interleaved to achieve 10-GS/s sample rate, and mismatches between sub-ADCs are calibrated in the background. The pipeline sub-ADCs employ a variety of techniques to lower power, like avoiding a dedicated sample-and-hold amplifier (SHA-less), residue scaling, flash background calibration, dithering and inter-stage gain error background calibration. A push–pull input buffer optimized for high-frequency linearity drives the interleaved sub-ADCs to enable >7-GHz bandwidth. A fast turn-ON bootstrapped switch enables 100-ps sampling. The ADC also includes the ability to randomize the sub-ADC selection pattern to further reduce residual interleaving spurs.