학술논문

Spectral and Short Term Stability Measurements
Document Type
Periodical
Source
IEEE Transactions on Instrumentation and Measurement IEEE Trans. Instrum. Meas. Instrumentation and Measurement, IEEE Transactions on. 23(4):518-521 Dec, 1974
Subject
Power, Energy and Industry Applications
Components, Circuits, Devices and Systems
Stability
Oscillators
Frequency measurement
Noise measurement
Spectral analysis
Counting circuits
Density measurement
Phase measurement
Time measurement
Frequency conversion
Language
ISSN
0018-9456
1557-9662
Abstract
The noise performance of an oscillator can be given either in the spectral or in the time domain. Two types of apparatus are generally necessary to measure these noise characteristics, spectral analyzers and frequency counters. The system described uses spectral density to time domain conversion and measures both the short term frequency stability and the phase spectral density of an oscillator. Bias functions, depending on the spectral density, are calculated. They are used to determine systematic errors introduced by the apparatus.