학술논문

Charge sharing aware NCL gates design
Document Type
Conference
Source
2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS) Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2013 IEEE International Symposium on. :212-217 Oct, 2013
Subject
Components, Circuits, Devices and Systems
Computing and Processing
Logic gates
Transistors
Capacitance
Switches
Robustness
Optimization
CMOS integrated circuits
reliability
charge sharing
null convention logic
Language
ISSN
1550-5774
2377-7966
Abstract
Interest in asynchronous circuits has increased in the VLSI research community due the growing limitations faced during the design of synchronous circuits, which often result in over constrained design and operation. For designing asynchronous circuits quasi-delay-insensitive approaches are often preferable due to their simple timing analysis and closure. Null Convention Logic (NCL) is a style that supports quasi-delay-insensitive design and enables power-, area- and speed-efficient circuits using a standard-cell methodology. However, the correct functionality of such circuits can be jeopardized by glitches caused by charge sharing effects, which can generate single event upsets. This work scrutinizes the electrical behavior of NCL gates and proposes design optimizations that improve their robustness to charge sharing glitches. Experimental results suggest that the proposed optimizations lead to more robust implementations, increasing fault avoidance and reliability in such circuits.