학술논문

Behavior of post insulators during UHV dc test
Document Type
Periodical
Source
IEEE Transactions on Dielectrics and Electrical Insulation IEEE Trans. Dielect. Electr. Insul. Dielectrics and Electrical Insulation, IEEE Transactions on. 8(1):150-156 Feb, 2001
Subject
Fields, Waves and Electromagnetics
Engineered Materials, Dielectrics and Plasmas
Insulator testing
Voltage
Dielectrics and electrical insulation
Electrodes
Life testing
Accelerated aging
Life estimation
Stress
Surges
Sulfur hexafluoride
Language
ISSN
1070-9878
1558-4135
Abstract
This paper presents experimental results on post insulators subjected to ultra high dc voltages in the range of 1 to 4.8 MV. The behavior of new and aged insulators has been studied recently during diagnostic and accelerated aging tests, in order to characterize both their withstand and recovery voltages, as well as estimate their remaining life time. Estimation of their remaining life time enables a better prediction of maintenance intervals, thus avoiding unnecessary and costly downtime periods. Measurements of the recovery voltage also have been performed on insulators presenting defects, following dielectric failure in service. The results of the accelerated aging tests carried out demonstrates a faster assessment of the post insulators performance.