학술논문
Dynamic Gate Drive for SiC Power MOSFETs with Sub-nanosecond Timings
Document Type
Conference
Author
Source
2023 IEEE Applied Power Electronics Conference and Exposition (APEC) Applied Power Electronics Conference and Exposition (APEC), 2023 IEEE. :324-330 Mar, 2023
Subject
Language
ISSN
2470-6647
Abstract
A dynamic gate driving strategy is proposed to control the turn-off $\boldsymbol{dV}_{\boldsymbol{DS}}/\boldsymbol{dt}$ transients for SiC power MOSFETs. Compared with a conventional gate driver with fixed gate resistance, dynamic gate drive can effectively suppress the VDS overshoot without a significant reduction in switching speed or increase in turn-off loss. In double pulse testing, using a 40 A, 1200 V SiC power MOSFET, the dynamic gate driver exhibits a 78% reduction in turn-off energy loss $(\boldsymbol{E}_{off})$ when compared to a conventional gate driver for a 35% overshoot. Moreover, it is also found that SiC power MOSFETs require much more stringent timing resolution (< 1 ns) for the dynamic gate driving pattern when compared to Si IGBTs with the similar current and voltage ratings to fine tune $\boldsymbol{dV}_{\boldsymbol{DS}}/\boldsymbol{dt}$. This paper demonstrates and analyzes the advantages of dynamic gate driving for SiC power MOSFETs with precision timing.