학술논문

Demonstration of 10 kV, 50A 4H-SiC DMOSFET with stable subthreshold characteristics across 25–200 °C operating temperatures
Document Type
Conference
Source
2007 International Semiconductor Device Research Symposium Semiconductor Device Research Symposium, 2007 International. :1-2 Dec, 2007
Subject
Components, Circuits, Devices and Systems
Engineered Materials, Dielectrics and Plasmas
Silicon carbide
MOSFETs
Temperature distribution
Electric breakdown
Temperature dependence
Threshold voltage
Breakdown voltage
Solid state circuits
Intrusion detection
Educational institutions
Language
Abstract
This paper has described the fabrication and demonstration of 10 kV SiC MOSFETs, with active areas of 0.15 cm 2 and 0.61 cm 2 , capable of operating at 5-10 A and 20-50 A respectively, and demonstrating excellent, stable subthreshold characteristics as a function of operating temperature (