학술논문

Harnessing machine learning to improve the success rate of stimuli generation
Document Type
Conference
Source
Tenth IEEE International High-Level Design Validation and Test Workshop, 2005. High-Level Design Validation and Test High-Level Design Validation and Test Workshop, 2005. Tenth IEEE International. :112-118 2005
Subject
Computing and Processing
Machine learning
Testing
Electronic mail
Hardware
Laboratories
Computer science
Test pattern generators
Event detection
Law
Legal factors
Language
ISSN
1552-6674
Abstract
The initial state of a design under verification has a major impact on the ability of stimuli generators to successfully generate the requested stimuli. For complexity reasons, most stimuli generators use sequential solutions without planning ahead. Therefore, in many cases they fail to produce consistent stimuli due to an inadequate selection of the initial state. We propose a method, based on machine learning techniques, to improve generation success by learning the relationship between the initial state vector and generation success. We applied the proposed method in two different settings, with the objective of improving generation success and coverage in processor and system level generation. In both settings, the proposed method significantly reduced generation failures and enabled faster coverage.