학술논문

Community Detection and Growth Potential Prediction Using the Stochastic Block Model and the Long Short-term Memory from Patent Citation Networks
Document Type
Conference
Source
2018 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM) Industrial Engineering and Engineering Management (IEEM), 2018 IEEE International Conference on. :1884-1888 Dec, 2018
Subject
Aerospace
Components, Circuits, Devices and Systems
Computing and Processing
Engineering Profession
General Topics for Engineers
Nuclear Engineering
Robotics and Control Systems
Signal Processing and Analysis
Transportation
Patents
Games
Stochastic processes
Databases
Modeling
Technology management
Industries
Patent
Stochastic Block Model
Long Short-Term Memory
Patent scoring
Language
ISSN
2157-362X
Abstract
Scoring patent documents is very useful for technology management. However, conventional methods are based on static models and, thus, do not reflect the growth potential of the technology cluster of the patent. Because even if the cluster of a patent has no hope of growing, we recognize the patent is important if PageRank or other ranking score is high. Therefore, there arises a necessity of developing citation network clustering and prediction of future citations. In our research, clustering of patent citation networks by Stochastic Block Model was done with the aim of enabling corporate managers and investors to evaluate the scale and life cycle of technology. As a result, we confirmed nested SBM is appropriate for graph clustering of patent citation networks. Also, a high MAPE value was obtained and the direction accuracy achieved a value greater than 50% when predicting growth potential for each cluster by using LSTM.