학술논문

RotR: Rotational redundant task mapping for fail-operational MPSoCs
Document Type
Conference
Source
2015 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS) Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS), 2015 IEEE International Symposium on. :21-28 Oct, 2015
Subject
Components, Circuits, Devices and Systems
Computing and Processing
Tunneling magnetoresistance
Transient analysis
Redundancy
Fault tolerant systems
Computer architecture
Language
ISSN
1550-5774
2377-7966
Abstract
As transient and permanent failures are rise shrinking process technology, MPSoC systems with fail-operational behavior have become important, especially for safety-critical applications. We therefore propose RotR, a rotational task mapping approach for an active-redundancy-based system to facilitate parallel execution of redundant tasks. RotR maps tasks such that no single failure affects more than one copy of a redundant task, and utilizes a multi-functional voter task that adapts its functionality based on the system's redundancy state after each component failure. RotR mapping and the proposed voter task jointly enable fail-operational behavior by seamlessly transitioning from higher reliability (e.g., Triple Modular Redundancy) to lower reliability (e.g., Double Modular Redundancy) without requiring task remapping. Our results show that RotR improves a system's fault-tolerant lifetime on average by 37% and 48% over standard DMR and TMR systems, respectively. Furthermore, it improves the overall lifetime by 29% compared to the baseline system having no redundancy.