학술논문

The differential absorption hard x-ray spectrometer at the Z facility
Document Type
Periodical
Source
IEEE Transactions on Plasma Science IEEE Trans. Plasma Sci. Plasma Science, IEEE Transactions on. 45(8):2393-2398 Aug, 2017
Subject
Engineered Materials, Dielectrics and Plasmas
Fields, Waves and Electromagnetics
Tungsten
Photonics
Wires
Silicon
Arrays
PIN photodiodes
Collimators
Plasma measurements
plasma pinch
pulsed-power systems
radiation detectors
silicon radiation detectors
X-ray detectors
Language
ISSN
0093-3813
1939-9375
Abstract
The differential absorption hard X-ray (DAHX) spectrometer is a diagnostic developed to measure time-resolved radiation between 60 keV and 2 MeV at the Z Facility. It consists of an array of seven Si PIN diodes in a tungsten housing that provides collimation and coarse spectral resolution through differential filters. DAHX is a revitalization of the hard X-ray spectrometer that was fielded on Z prior to refurbishment in 2006. DAHX has been tailored to the present radiation environment in Z to provide information on the power, spectral shape, and time profile of the hard emission by plasma radiation sources driven by the Z machine.