학술논문

Different Approaches for Mathematical Evaluation of Resorption Currents in Nanodielectrics
Document Type
Conference
Source
2018 IEEE International Conference on High Voltage Engineering and Application (ICHVE) High Voltage Engineering and Application (ICHVE), 2018 IEEE International Conference on. :1-4 Sep, 2018
Subject
Engineered Materials, Dielectrics and Plasmas
Power, Energy and Industry Applications
Dielectrics
Dielectric measurement
Insulation
Current measurement
Space charge
Conferences
Production
Language
ISSN
2474-3852
Abstract
The main goal of this research is to introduce three different kinds of mathematical methods for evaluation of dielectric resorption. These methods will be applied on dielectric contains filler with nano- dimensions. Dielectrics which contained different amount of nano- filler SiO 2 have been prepared for this study (0, 0.25, 0.5, 0.75, 1.5 and 3 percent by weight). The process of sample production is described in detail. The average values of resorption currents were investigated by the method of Reduced Resorption Curves (RRCs), by the method of determination of the area over the curve and by the method of tangent determination. Individual methods are described in detail with all mathematical formulas, definitions, and illustrations. Selected methods may be used for evaluation of the behavior of the residual charge in solid insulation.