학술논문
Timing Defect Diagnosis in Presence of Crosstalk for Nanometer Technology
Document Type
Conference
Source
2006 IEEE International Test Conference Test Conference, 2006. ITC '06. IEEE International. :1-10 Oct, 2006
Subject
Language
ISSN
1089-3539
2378-2250
2378-2250
Abstract
With feature sizes shrinking, manufacturing defects and parameter variations often cause design timing failures. Crosstalk coupling is one of such causes. It is essential that timing failures be correctly and quickly diagnosed. We present a methodology to diagnose the delay-defect in presence of crosstalk, given the physical information such as crosstalk coupling capacitance, neighborhood information and SDF delay information. We provide diagnosis results for 180, 130, 90 and 65 nm technologies.