학술논문

Delay fault diagnosis for nonrobust test
Document Type
Conference
Source
7th International Symposium on Quality Electronic Design (ISQED'06) Quality Electronic Design Quality Electronic Design, 2006. ISQED '06. 7th International Symposium on. :8 pp.-472 2006
Subject
Components, Circuits, Devices and Systems
Fault diagnosis
Testing
Propagation delay
Failure analysis
Manufacturing
Timing
Error correction
Algorithm design and analysis
Performance evaluation
Robustness
Language
ISSN
1948-3287
1948-3295
Abstract
With feature sizes steadily shrinking, manufacturing defects and parameter variations often cause design timing failures. It is essential that those errors be correctly and quickly diagnosed. The existing delay-fault diagnosis algorithms cannot identify the delay faults that require nonrobust tests, because they ignore nonrobust propagation conditions while emulating the failure analyzer's behavior. We propose a novel approach to perform delay-fault diagnosis for robust and nonrobust tests. The experimental results show that our approach can diagnose delay faults with good resolution. It is stable with respect to delay variations that the failure analyzer might experience.