학술논문
IP Session on Chiplet: Design, Assembly, and Test
Document Type
Conference
Author
Source
2023 IEEE 41st VLSI Test Symposium (VTS) VLSI Test Symposium (VTS), 2023 IEEE 41st. :1-1 Apr, 2023
Subject
Language
ISSN
2375-1053
Abstract
This IP session will consist of three presentations. A summary of each presentation is given below.