학술논문

Characterization Of Gated Silicon Field Emission Micro Triodes
Document Type
Conference
Source
[Proceedings] IVMC '93 Sixth International Vacuum Microelectronics Conference Vacuum Microelectronics Conference, 1993., Proceedings of IEEE 6th International. :52-53 1993
Subject
Components, Circuits, Devices and Systems
Engineered Materials, Dielectrics and Plasmas
Fields, Waves and Electromagnetics
Silicon
Current measurement
Voltage
Circuit testing
Microelectronics
Chemical technology
Physics
Chemistry
Process control
Writing
Language