학술논문

Artifact-Free Coring Procedures for Removing Samples from Photovoltaic Modules for Microscopic Analysis
Document Type
Conference
Source
2018 IEEE 7th World Conference on Photovoltaic Energy Conversion (WCPEC) (A Joint Conference of 45th IEEE PVSC, 28th PVSEC & 34th EU PVSEC) Photovoltaic Energy Conversion (WCPEC), 2018 IEEE 7th World Conference on. :1313-1317 Jun, 2018
Subject
Aerospace
Components, Circuits, Devices and Systems
Engineered Materials, Dielectrics and Plasmas
Photonics and Electrooptics
Power, Energy and Industry Applications
Glass
Silicon
II-VI semiconductor materials
Cadmium compounds
Delamination
Microscopy
Solar panels
Coring
photovoltaic modules
Si
CIGS
CdTe.
Language
Abstract
An important step in producing more reliable and efficient photovoltaic modules is to establish a relationship between the microscopic properties of modules deployed in the field for many years and efficiency-related parameters. The first step in accomplishing this task is to be able to identify and remove small areas from these modules without causing any damage to these samples. In this work, we will describe two different procedures to core small areas of deployed and stressed solar panels produced with different materials (Si, CIGS, and CdTe), and we will prove that these processes did not damage the cored material. We will also show that the coring procedure changes for different types of photovoltaic modules.