학술논문

Impact of Program Accuracy and Random Telegraph Noise on the Performance of a NOR Flash-based Neuromorphic Classifier
Document Type
Conference
Source
ESSDERC 2019 - 49th European Solid-State Device Research Conference (ESSDERC) Solid-State Device Research Conference (ESSDERC), 2019 49th European. :122-125 Sep, 2019
Subject
Components, Circuits, Devices and Systems
Computing and Processing
Engineered Materials, Dielectrics and Plasmas
General Topics for Engineers
Photonics and Electrooptics
Power, Energy and Industry Applications
Language
ISSN
2378-6558
Abstract
In this work, we investigate the impact of program accuracy and of the time instabilities in cell threshold-voltage (V T ) arising from random telegraph noise (RTN) on the performance of a neuromorphic digit classifier exploiting NOR Flash arrays as artificial synaptic arrays. First, by modeling cell V T placement resulting from a program-and-verify algorithm based on incremental step pulse programming (ISPP) in the presence of program noise, the classifier truthfulness is investigated as a function of the discretization step of the verify level and of the cell control-gate–to–floating-gate capacitance. Then, the degradation of the classifier accuracy due to RTN fluctuations displacing cell V T from its programmed value is addressed as a function of the most relevant RTN statistical parameter, i.e., the average value of the single-trap fluctuation amplitude. Results highlight some quantitative criteria to determine how scaled NOR Flash cells and arrays can be when targeting neuromorphic applications.