학술논문

Vector corrected on-wafer power measurements of frequency converting two-ports
Document Type
Conference
Source
1996 IEEE MTT-S International Microwave Symposium Digest Microwave symposium Microwave Symposium Digest, 1996., IEEE MTT-S International. 3:1281-1284 vol.3 1996
Subject
Components, Circuits, Devices and Systems
Engineered Materials, Dielectrics and Plasmas
Fields, Waves and Electromagnetics
Aerospace
Communication, Networking and Broadcast Technologies
Photonics and Electrooptics
Power measurement
Frequency measurement
Frequency conversion
Power system harmonics
Synthesizers
Instruments
Spectral analysis
Testing
Circuits
Scattering parameters
Language
ISSN
0149-645X
Abstract
In this paper a universal nonlinear measurement system is presented. The On-Wafer approach described here is commercially available and utilizes a modified vectorial network analyzer (Wiltron 360 B) and a special software package developed at the IMST. The system determines the complex quantities of all power waves at all ports of the DUT. Since measurements are carried out at all interesting harmonics, the system is ideal for the complete electrical characterization of a frequency multiplier for instance. In contrast to other power and harmonic measurement approaches using VNAs, the technique proposed here does not need an additional microwave synthesizer for locking the receiver to the harmonics. The described system exhibits a power sweep range of more than 80 dB.