학술논문
Separating timing, data, and format in a tester-independent waveform representation
Document Type
Conference
Source
[1989] Proceedings of the 1st European Test Conference European Test Conference, 1989., Proceedings of the 1st. :377-382 1989
Subject
Language
Abstract
The authors describe a tester-independent representation for digital waveforms which permits the separate manipulation of timing, data and format. This object-oriented approach is compact, extensible, and independent of tester architecture while still permitting the representation of a variety of tester featured such as multiclock modes, multiplex modes, and midcycle I/O transitions. Several examples illustrate transformations which can be performed on this representation while preserving the original waveforms. Also included is a short discussion of implementation experience and space requirements.ETX