학술논문
Guest Editors’ Introduction: SBCCI 2019
Document Type
Periodical
Author
Source
IEEE Design & Test IEEE Des. Test Design & Test, IEEE. 38(4):60-61 Aug, 2021
Subject
Language
ISSN
2168-2356
2168-2364
2168-2364
Abstract
This special issue includes five articles selected among the best articles of the 32nd Symposium on Integrated Circuits and Systems Design which was held in São Paulo, Brazil, on August 26–39, 2019. An improved version of each article was diligently prepared by the authors and extensively reviewed before being accepted for publication in IEEE Design & Test .