학술논문

Semi-automation Delta-L for PCB Loss Electrical Characterization
Document Type
Conference
Source
2018 13th International Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT) Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT), 2018 13th International. :154-156 Oct, 2018
Subject
Components, Circuits, Devices and Systems
Probes
Loss measurement
Time measurement
Frequency measurement
Testing
Volume measurement
Atmospheric measurements
Language
ISSN
2150-5942
Abstract
In high-frequency electrical characterization, it is very important to have good measurement stability and repeatability. Conventionally, co-axial connector is used for the high quality and robust measurement. Handheld probes with the accepted quality were validated and widely adopted to reduce the measurement resource. However, the measurement quality by different users are much different in the round robin study and these difference may cause by the probe design, contact quality, measurement setup, engineer operation and etc. How to reduce the measurement variation affected by engineer operation in high-volume measurement is critical, especially for over 20GHz high-frequency application. Therefore, semi-automation Delta-L solution was proposed and developed for PCB loss characterization to improve the measurement stability and reduce the variation caused by engineer operation.