학술논문

High RA Dual-MTJ SOT-MRAM devices for High Speed (10ns) Compute-in-Memory Applications
Document Type
Conference
Source
2023 International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2023 International. :1-4 Dec, 2023
Subject
Bioengineering
Communication, Networking and Broadcast Technologies
Components, Circuits, Devices and Systems
Computing and Processing
Engineered Materials, Dielectrics and Plasmas
Fields, Waves and Electromagnetics
Nuclear Engineering
Photonics and Electrooptics
Power, Energy and Industry Applications
Robotics and Control Systems
Signal Processing and Analysis
Resistance
Voltage measurement
Image edge detection
Software
Time measurement
Tuning
Switching circuits
Language
ISSN
2156-017X
Abstract
The rapid development of artificial intelligence in recent decades has been continuously driving new software and hardware advancements. High-dimensional matrix-vector multiplication (MVM) is a crucial component in signal processing and machine learning computations. To achieve MVM, the 2D crossbar array of memristors has been widely discussed and studied. In this work, a novel SOT-MRAM device structure with 10ns write speed and >100x scalable resistance and read current are demonstrated to address the persistent problems of the traditional 2D crossbar array, leveraging its read-write path separation nature.