학술논문

Evaluation of long-term reliability of power cable including nano-conductive layer
Document Type
Conference
Source
2017 International Symposium on Electrical Insulating Materials (ISEIM) Electrical Insulating Materials (ISEIM), 2017 International Symposium on. 2:644-645 Sep, 2017
Subject
Engineered Materials, Dielectrics and Plasmas
Fields, Waves and Electromagnetics
Nuclear Engineering
Photonics and Electrooptics
Power, Energy and Industry Applications
Power cables
Cable insulation
Carbon
Reliability
Conductors
Trees - insulation
Electric fields
Long-trem Reliability
Nano-SemiConductive
VLF TD
Language
Abstract
The internal and external semiconductors in the power cable have semiconducting properties and serve as a polymer material to prevent the concentration of electric fields that may occur between the insulator and the conductor and to uniformly distribute the electric field radially. In this paper, we will construct a model cable using commercial and Nano-semiconductor and evaluate long-term reliability by measuring VLF (Very Low Frequency) TD (Tan Delta).