학술논문

On $V_{{\text{ce}}}$ Method: In Situ Temperature Estimation and Aging Detection of High-Current IGBT Modules Used in Magnet Power Supplies for Particle Accelerators
Document Type
Periodical
Source
IEEE Transactions on Industrial Electronics IEEE Trans. Ind. Electron. Industrial Electronics, IEEE Transactions on. 66(1):551-560 Jan, 2019
Subject
Power, Energy and Industry Applications
Signal Processing and Analysis
Communication, Networking and Broadcast Technologies
Insulated gate bipolar transistors
Current measurement
Temperature measurement
Aging
Voltage measurement
Temperature sensors
Aging detection
insulated gate bipolar transistor (IGBT)
magnet power supplies
measuring circuits design
particle accelerators
temperature monitoring
+%24{V%5F{{%5Crm{ce}}}}%5C+%24<%2Ftex-math>+<%2Finline-formula>+method%22"> ${V_{{\rm{ce}}}}\ $ method
Language
ISSN
0278-0046
1557-9948
Abstract
Magnet power supplies used in particle accelerators are a specialized application of power electronics that require long lifetime operation with no unscheduled interruptions and high output current precision. In this paper, the ${V_{{\rm{ce}}}}\ $ method with sensing current is considered for the estimation of the junction temperature and the aging detection of high-current insulated gate bipolar transistor (IGBT) modules used in this specialized application. First, sensitivity analysis of the sensing current and the gate–emitter voltage are documented to quantify their impact on the precision of the ${V_{{\rm{ce}}}}\ $ method for high-current modules independently of the application of interest. Two measuring circuits offering ease of calibration and reduced number of components are proposed but their applicability is not limited to this application. Their performance is tested on a 1.6 kA IGBT module that exhibits the highest current ratings documented for the ${V_{{\rm{ce}}}}\ $ method with sensing current. The test is carried out at a switching frequency of 6.5 kHz using an experimental set-up that emulates a phase leg of the considered power supply. The ${V_{{\rm{ce}}}}\ $ method with sensing current is evaluated for the aging detection of high-current IGBT modules in general and its effectiveness for the specialized application is verified experimentally.