학술논문

Influence of environmental parameters and testing process during microprocessor experiments with low irradiation dose rates
Document Type
Conference
Source
RADECS 91 First European Conference on Radiation and its Effects on Devices and Systems Radiation and its Effects on Devices and Systems, 1991. RADECS 91., First European Conference on. :529-533 1991
Subject
Fields, Waves and Electromagnetics
Components, Circuits, Devices and Systems
Engineered Materials, Dielectrics and Plasmas
Nuclear Engineering
Microprocessors
Temperature
Circuit testing
Resumes
Safety
Degradation
System testing
Cobalt
Language
Abstract
Within the framework of nuclear safety studies, an experimental program has been initiated some years ago in order to determine the most important parameters to take into account for experiments on microprocessors placed in a low dose rate nuclear irradiation environment. The authors, after briefly describing the preceding published results, present the most recent results obtained especially about the effects of the temperature, the origin of the batches, the angle of the incident irradiation, the used testing device.ETX