학술논문

Performance visualization algorithm of PV module for establishing life time estimation technology
Document Type
Conference
Source
2020 47th IEEE Photovoltaic Specialists Conference (PVSC) Photovoltaic Specialists Conference (PVSC), 2020 47th IEEE. :0359-0365 Jun, 2020
Subject
Aerospace
Components, Circuits, Devices and Systems
Engineered Materials, Dielectrics and Plasmas
Photonics and Electrooptics
Power, Energy and Industry Applications
Temperature measurement
Resistance
Current measurement
Radiation effects
Electrical resistance measurement
Temperature
Short-circuit currents
PV performance
IV characteristic
exposure
Shunt resistance
luminance of El image
Language
Abstract
We developed the algorithm for quantifying performance from PV module's I-V characteristics measured in exposure for estimating the lifetime of PV modules. The developed algorithm can accurately detect the PV module's shunt resistance from the I-V characteristic measured in exposure. Further, this algorithm can convert the detected shunt resistance to the current generated by recombination of minority carriers in the PV module. The rate of the recombination current change was compared with the rate of change in luminance of the EL image measured indoors, and a high correlation of 96.7% was obtained.