학술논문
Evaluation of built-in test
Document Type
Periodical
Author
Source
IEEE Transactions on Aerospace and Electronic Systems IEEE Trans. Aerosp. Electron. Syst. Aerospace and Electronic Systems, IEEE Transactions on. 37(1):266-271 Jan, 2001
Subject
Language
ISSN
0018-9251
1557-9603
2371-9877
1557-9603
2371-9877
Abstract
Built-in test (BIT) provides fault finding as a means to aid in system assembly, test, and maintenance. An investigation to evaluate BIT of a particular electronics board used in the in-flight entertainment system for Boeing 777s is described. We found BIT proved useful when failure occurrences were uniquely associated with the operating environment, situations which can result in no-fault found, or could-not duplicate (CND) failures upon test. We also observed cases where the BIT failed to observe failures, and in some cases pointed to the wrong cause of failure. These and other advantages and disadvantages of BIT implementation are discussed.