학술논문

Challenges in Test and Measurement for 100GE serial TDM system studies
Document Type
Conference
Source
2007 Digest of the IEEE/LEOS Summer Topical Meetings IEEE/LEOS Summer Topical Meetings, 2007 Digest of the. :262-263 Jul, 2007
Subject
Photonics and Electrooptics
Components, Circuits, Devices and Systems
Engineered Materials, Dielectrics and Plasmas
System testing
Time division multiplexing
Signal generators
Optical receivers
Bandwidth
Velocity measurement
High speed optical techniques
Optical modulation
Optical signal processing
Stimulated emission
Language
ISSN
1099-4742
2376-8614
Abstract
This presentation seeks to address some key test and measurement issues currently facing the R&D community investigating the feasibility of serial 100Gb Ethernet as a viable next generation high speed data communication solution.