학술논문

Electrothermal Transport in Carbon Nanostructures
Document Type
Conference
Source
2007 14th International Symposium on the Physical and Failure Analysis of Integrated Circuits Physical and Failure Analysis of Integrated Circuits, 2007. IPFA 2007. 14th International Symposium on the. :155-158 Jul, 2007
Subject
Components, Circuits, Devices and Systems
Engineered Materials, Dielectrics and Plasmas
Fields, Waves and Electromagnetics
General Topics for Engineers
Electrothermal effects
Nanostructures
Annealing
Contacts
Resistance heating
Electrons
Carbon nanotubes
Tunneling
Electric variables
Thermal stresses
Language
ISSN
1946-1542
1946-1550
Abstract
Heat generation in carbon nanofibers (CNF) has raised under vacuum. The annealing is shown to reduce the overall concerns regarding reliability in these structures under high- low-bias resistance. A typical I-V set of annealing current conditions. This work addresses the interplay experiments is shown in Figure 2. For this CNF, the initial between electron transport and resulting Joule heating in resistance is 46 kQ, then reduced to 32 kQ after one anneal, CNFs. The model relates current to power dissipation and finally reduced to 11 kQ after the second annealing step. leading to temperature rise in the structure, thus elucidating A third anneal is performed to ensure that the lowest the relationship between thermal and electrical properties in resistance has been achieved in the structure, and confirms carbon nanostructures.