학술논문

Error correction techniques for high-performance differential A/D converters
Document Type
Periodical
Source
IEEE Journal of Solid-State Circuits IEEE J. Solid-State Circuits Solid-State Circuits, IEEE Journal of. 25(6):1318-1327 Dec, 1990
Subject
Components, Circuits, Devices and Systems
Engineered Materials, Dielectrics and Plasmas
Computing and Processing
Error correction
Capacitors
Voltage
Analog circuits
Circuit noise
Semiconductor device noise
CMOS process
CMOS logic circuits
Dynamic range
Analog-digital conversion
Language
ISSN
0018-9200
1558-173X
Abstract
Error correction techniques that overcome several error mechanism that can affect the accuracy of charge-redistribution analog-to-digital converters (ADCs) are described. A correction circuit and a self-calibration algorithm are used to improve the common-mode rejection of the differential ADC. A modified technique is used to self-calibrate the capacitor ratio errors and obtain higher linearity. The residual error of the ADC due to capacitor voltage dependence is minimized using a quadratic voltage coefficient (QVC) self-calibration scheme. A dual-comparator topology with digital error correction circuitry is used to avoid errors due to comparator threshold hysteresis. A fully differential charge-redistribution ADC implemented with these techniques was fabricated in a 5-V 1- mu m CMOS process using metal-to-polysilicide capacitors. The successive-approximation converter achieves 16-b accuracy with more than 90 dB of common-mode rejection while converting at a 200-kHz rate.ETX