학술논문

M/Si-GaAs/M diode: Role of the metal contact in electrical transport, a-particle and photon detection
Document Type
Conference
Source
The Tenth International Conference on Advanced Semiconductor Devices and Microsystems Advanced Semiconductor Devices & Microsystems (ASDAM), 2014 10th International Conference on. :1-4 Oct, 2014
Subject
Components, Circuits, Devices and Systems
Photonics and Electrooptics
Voltage measurement
Photonics
Silicon
Metallization
Current measurement
Breakdown voltage
Language
Abstract
M/Semi-insulating (SI) GaAs/M diodes with novel Mg-based metallization are investigated using current-voltage measurement, α-particle and photon detection. An anomalous decrease of the reverse current and peculiar photon spectra has been observed with such contact explainable by a strong electron accumulation due to the creation of a quasi-degenerate region at the Mg/SI-GaAs interface.