학술논문

Reproducing the “Framing” by a Sequential Stress Test
Document Type
Conference
Source
2019 IEEE 46th Photovoltaic Specialists Conference (PVSC) Photovoltaic Specialists Conference (PVSC), 2019 IEEE 46th. :1403-1409 Jun, 2019
Subject
Components, Circuits, Devices and Systems
Power, Energy and Industry Applications
framing
snail trail
ultraviolet (UV)-induced degradation
metallization
photovoltaic (PV) module
Language
Abstract
The "Framing" (local discoloration along cell edges) was induced by a simple sequential accelerated stress test (consisting of hygrothermal- and UV-stressors) applied to the PV modules with high OTR (oxygen transmission rate) backsheet, irrespective of the inclusion of UV-absorber in poly(ethylene-co-vinyl acetate) (EVA) encapsulant. UV-fluorescence imaging of the PV modules suggests that the spatially-inhomogeneous degradation of EVA material under UV-irradiating conditions is correlated to this "Framing" indicating an underlying common mechanism. These findings would contribute to the development of test procedures to broadly mimic the actual failures observed in fielded PV.