학술논문
Mitigation of Single-Event Charge Sharing in a Commercial FPGA Architecture
Document Type
Periodical
Author
Source
IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 61(4):1635-1642 Aug, 2014
Subject
Language
ISSN
0018-9499
1558-1578
1558-1578
Abstract
The motivation for single event effects (SEE) analysis and mitigation as part of the process for adaptation of a commercial Field Programmable Gate Array (FPGA) architecture for space-qualified applications is discussed. The interdependent roles of heavy-ion and laser-induced upset evaluation coupled with computer-aided investigations of SEE mechanisms and mitigation techniques in this process are shown to enable a significant reduction in SEE sensitivity of the device, while achieving minimal impact on remanufacturing steps.