학술논문
Review of TID Effects Reported in ProASIC3 and ProASIC3L FPGAs for 3D PLUS Camera Heads
Document Type
Conference
Author
Source
2023 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2023 NSREC) Radiation Effects Data Workshop (REDW) (in conjunction with 2023 NSREC), 2023 IEEE. :1-6 Jul, 2023
Subject
Language
ISSN
2154-0535
Abstract
This paper compares original TID data from ProA-SIC3L FPGAs with existing literature, discusses the impact of different test flows on the TID response, and correlates the data with TID tests of 3D PLUS camera heads.