학술논문

Active pixel sensor for X-ray imaging spectroscopy
Document Type
Conference
Source
2001 IEEE Nuclear Science Symposium Conference Record (Cat. No.01CH37310) Nuclear science symposium Nuclear Science Symposium Conference Record, 2001 IEEE. 1:15-19 vol.1 2001
Subject
Nuclear Engineering
Power, Energy and Industry Applications
Fields, Waves and Electromagnetics
Engineered Materials, Dielectrics and Plasmas
Pixel
Image sensors
X-ray imaging
Spectroscopy
Optical imaging
Space missions
FETs
Energy consumption
Lighting
Detectors
Language
ISSN
1082-3654
Abstract
A promising candidate for the wide field imaging spectrometer of the European Space Agency's X-ray Evolving Universe Spectroscopy (XEUS) mission is the Active Pixel Sensor (APS) based on the Depleted P-channel Field Effect Transistor (DEPFET). This concept combines low electronic noise with low power consumption, random accessibility of the pixels, high speed readout by parallel multi-channel processing, a fill factor of 100% by backside illumination and high quantum efficiency by an optimized entrance window and a fully depleted bulk. The DEPFET is a monolithic combination of detector and preamplifier with minimized capacitance and the possibility of repetitive non-destructive readout of the same signal thus reducing read noise. In this paper the DEPFET principle and the concepts of the APS and repetitive non-destructive readout are explained, measurements of single DEPFET structures and small APS prototypes are presented.