학술논문

Image processing for materials characterization: Issues, challenges and opportunities
Document Type
Conference
Source
2014 IEEE International Conference on Image Processing (ICIP) Image Processing (ICIP), 2014 IEEE International Conference on. :4862-4866 Oct, 2014
Subject
Components, Circuits, Devices and Systems
Materials
Image segmentation
Scanning electron microscopy
Three-dimensional displays
Microstructure
Image Processing
Image-based Analysis
Materials science
Stochastic modeling
Surface Science
Texture Analysis
Work-flow
Language
ISSN
1522-4880
2381-8549
Abstract
This introductory paper aims at summarizing some problems and state-of-the-art techniques encountered in image processing for material analysis and design. Developing generic methods for this purpose is a complex task given the variability of the different image acquisition modalities (optical, scanning or transmission electron microscopy; surface analysis instrumentation, electron tomography, micro-tomography …), and material composition (porous, fibrous, granular, hard materials, membranes, surfaces and interfaces …). This paper presents an overview of techniques that have been and are currently developed to address this diversity of problems, such as segmentation, texture analysis, multiscale and directional features extraction, stochastic models and rendering, among others. Finally, it provides references to enter the issues, challenges and opportunities in materials characterization.