학술논문
Test Compression Based on Lossy Image Encoding
Document Type
Conference
Source
2011 Asian Test Symposium Test Symposium (ATS), 2011 20th Asian. :273-278 Nov, 2011
Subject
Language
ISSN
1081-7735
2377-5386
2377-5386
Abstract
Test compression / decompression is one of effective methods for testing today's VLSI. In this paper, we discuss test compression with image compression algorithms, e.g., JPEG algorithm. Image compression algorithms can not only achieve considerably high compression but also require no additional decompression circuity on a chip under test if the chip includes image decoders. Moreover, we propose a method for generating seeds (or compressed test data) in the case where a JPEG decoder is utilized as a test decompress or. Although JPEG algorithm carries out lossy compression, given a test data, the proposed algorithm can search seeds that can be decompressed to another test data preserving the test quality of the given test data, and produce a small set of seeds with high fault coverage. Experimental results show the proposed method can achieve compression ratio comparable with several previous test compression methods without larger hardware overhead.