학술논문
How Do Deep Learning Faults Affect AI-Enabled Cyber-Physical Systems in Operation? A Preliminary Study Based on DeepCrime Mutation Operators
Document Type
Conference
Source
2023 ACM/IEEE International Symposium on Empirical Software Engineering and Measurement (ESEM) Empirical Software Engineering and Measurement (ESEM), 2023 ACM/IEEE International Symposium on. :1-7 Oct, 2023
Subject
Language
Abstract
Cyber-Physical Systems (CPSs) combine digital cyber technologies with physical processes. As in any other software system, in the case of CPSs, the use of Artificial Intelligence (AI) techniques in general, and Deep Neural Networks (DNNs) in particular, is contantly increasing. While recent studies have considerably advanced the field of testing AI-enabled systems, it has not yet been investigated how different Deep Learning (DL) bugs affect AI-enabled CPSs in operation. This work-in-progress paper presents a preliminary evaluation on how such bugs can affect CPSs in operation by using a mobile robot as a case study system. For that, we generated DL mutants by using operators proposed by Humbatova et al., which are operators based on real-world DL faults. Our preliminary investigation suggests that such bugs are more difficult to detect when they are deployed in operation rather than when testing their DNN in an off-line setup, which contrast with related studies.