학술논문

Reliability Modeling of Fault-Tolerant FPGA-Based Architectures in Space Applications for Soft and Hard Error Recovery
Document Type
Periodical
Source
IEEE Access Access, IEEE. 12:31930-31943 2024
Subject
Aerospace
Bioengineering
Communication, Networking and Broadcast Technologies
Components, Circuits, Devices and Systems
Computing and Processing
Engineered Materials, Dielectrics and Plasmas
Engineering Profession
Fields, Waves and Electromagnetics
General Topics for Engineers
Geoscience
Nuclear Engineering
Photonics and Electrooptics
Power, Energy and Industry Applications
Robotics and Control Systems
Signal Processing and Analysis
Transportation
Reliability
Computer architecture
Circuit faults
Field programmable gate arrays
Redundancy
Microprocessors
Fault tolerance
Single event upsets
DEU
fault tolerance
FPGA
reliability
SEU
TEU
Language
ISSN
2169-3536
Abstract
FPGAs are currently being used in many applications due to their flexibility and re-programmability. Some of these applications operate in harsh environments. One such environment is space. Focusing on space applications, these FPGAs are subjected to soft and hard faults. For newer technology nodes, in addition to the harsh space environment, these errors are more severe. This paper investigates several fault-tolerant architectures to mitigate Single Event Upsets (SEUs), Double Event Upsets (DEUs), Triple Event Upsets (TEUs) as well as hard faults. Conventionally, for TEUs, seven copies of a module are required (7MR). Therefore, a modified 7MR architecture is studied along with two other architectures with six redundant modules: a modified 6MR architecture and a modified Triple Duplex architecture. Using Continuous Time Markov Chains (CTMCs), it is proven that, in many of the cases studied in this article, the modified Triple Duplex architecture has a higher reliability than the modified 7MR architecture. This is a counter-intuitive result. It is also proven that the modified 6MR architecture always has a lower reliability than the modified Triple Duplex architecture even though they both require six redundant modules. The ratio between the relative rates of SEUs, DEUs and TEUs plays an important role in determining the most reliable architecture. Furthermore, the Xilinx Vivado tool with the Kintex7, 7k410tfbg676 device is used to implement the modified 7MR and modified Triple Duplex voters to estimate the area and power consumed by these techniques.