학술논문

High Resolution Spintronics Probe-Array Technology Solutions for Very Near-Field Scanning
Document Type
Conference
Source
2021 IEEE Conference on Antenna Measurements & Applications (CAMA) Antenna Measurements & Applications (CAMA), 2021 IEEE Conference on. :241-246 Nov, 2021
Subject
Aerospace
Bioengineering
Communication, Networking and Broadcast Technologies
Components, Circuits, Devices and Systems
Computing and Processing
Engineered Materials, Dielectrics and Plasmas
Engineering Profession
Fields, Waves and Electromagnetics
General Topics for Engineers
Geoscience
Power, Energy and Industry Applications
Signal Processing and Analysis
Temperature measurement
Magnetic field measurement
Magnetic sensors
Imaging
Josephson junctions
Magnetic fields
Thermal stability
Language
ISSN
2643-6795
Abstract
New integrated high-resolution Spintronics Probe-Array at nanometric and micronic scales are proposed for very-near field (VNF) scanning and OTA-testing of electronic circuits and radiating systems. The proposed technology solutions lead to small dimensions (micrometric range), reduced cost, and high magnetic field sensitivity at room temperature with tunability through smart-adaptive-biasing control. The measured performances exhibit improvements in terms of accuracy and thermal stability outperforming state of the art sensors based on SQUID techniques, Josephson junctions or loops-based technologies. Porting of chemically functionalized Spintronics into advanced FD-SOI platforms is proposed as an enabler of hybrid interferometric Thermal-Electromagnetic sensing based on unified analog-digital image-correlators using ASIC-System on a Chip (ASIC-SoC) integration solutions.