학술논문

High thermal stability of high-power phosphor based white-light-emitting diodes employing Ce:YAG-doped glass
Document Type
Conference
Source
2010 Proceedings 60th Electronic Components and Technology Conference (ECTC) Electronic Components and Technology Conference (ECTC), 2010 Proceedings 60th. :700-703 Jun, 2010
Subject
Components, Circuits, Devices and Systems
Engineered Materials, Dielectrics and Plasmas
Thermal stability
Phosphors
Glass
Light emitting diodes
Propagation losses
Aging
Semiconductor materials
Semiconductor device packaging
Semiconductor diodes
Degradation
Language
ISSN
0569-5503
2377-5726
Abstract
High thermal stability of high-power phosphor-converted white-light-emitting diodes (PC-WLEDs) incorporating a Ce:YAG-doped glass as the phosphor layer is demonstrated. An exploring study of lumen loss, chromaticity shift, and transmittance loss of high-power PC-WLEDs with Ce:YAG-doped glass and Ce:YAG-doped silicone under thermal aging at 150°C for 500 hours was performed and compared. The results showed that the high-power PC-WLEDs with 6 wt% of Ce:YAG-doped glass exhibited 60% less lumen loss, 50% lower chromaticity (CIE) shift, and 20 % smaller transmittance loss than with the Ce:YAG-doped silicone. This clearly indicates that the Ce:YAG-doped glass exhibits higher thermal stability than the Ce:YAG-doped silicone after thermal aging. A better thermal stability of glass phosphor layer may be beneficial to the many applications where the LEDs with high-power and high reliability are demanded.