학술논문
Single-Event Characterization of Bang-bang All-digital Phase-locked Loops (ADPLLs)
Document Type
Periodical
Author
Source
IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 62(6):2650-2656 Dec, 2015
Subject
Language
ISSN
0018-9499
1558-1578
1558-1578
Abstract
The single-event vulnerability of a bang-bang ADPLL is investigated through fault injection experiments and circuit simulations. Single-event upsets in the digital loop filter result in the worst-case error response of the ADPLL, often requiring phase reacquisition. Single-event tolerant design guidelines for the digital loop filter are proposed and validated through FPGA-based fault injection experiments.