학술논문

Ultimate MRAM Scaling: Design Exploration of High-Density, High-Performance and Energy-Efficient VGSOT for Last Level Cache
Document Type
Conference
Source
2023 International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2023 International. :1-4 Dec, 2023
Subject
Bioengineering
Communication, Networking and Broadcast Technologies
Components, Circuits, Devices and Systems
Computing and Processing
Engineered Materials, Dielectrics and Plasmas
Fields, Waves and Electromagnetics
Nuclear Engineering
Photonics and Electrooptics
Power, Energy and Industry Applications
Robotics and Control Systems
Signal Processing and Analysis
Resistance
Magnetic resonance imaging
Random access memory
Integrated circuit interconnections
Metals
Voltage
Switches
Writing
Delays
Magnetic tunneling
Language
ISSN
2156-017X
Abstract
The Voltage-Gated Spin-Orbit-Torque (VGSOT) MRAM is a unique multi-bit SOT-MRAM implementation with the aid of voltage-controlled magnetic anisotropy (VCMA). In this paper, we explore the Power-PerformanceArea scaling potential of VGSOT for last-level cache (LLC) towards 14-Å node, and profile the required device design space based on a hardware-validated compact model. We highlight the outstanding bit density of VGSOT-4MTJ up to ~ 3× of iso-node SRAM, which in an LLC-relevant, (16 – 32) MB memory macro brings down the global interconnect length by 40 %; this in turn translates to max. 60 % and 30 % overall delay and energy reduction, respectively, over SRAM. We nonetheless emphasize the essential all-aspect technology co-optimization of SOT track (in resistivity and Spin Hall angle) and MTJ stack (in VCMA efficiency) for unlocking the desired selective writing in a multi-bit VGSOT cell. We conclude that the multi-bit VGSOT provides an alternative, density-enabled, interconnect-centric scaling route for LLC.